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[Construction Achievements] Inline Horizontal Conveying Aging Test System

[Construction Achievements] Inline Horizontal Conveying Aging Test System

Both horizontal and vertical transportation methods are available! Compatible with various types of product lines.

We would like to introduce our achievements in the construction of an inline horizontal transport aging test system. Using our original product, the "Inline High/Low Temperature Testing Machine," we made it possible to conduct functional tests within the chamber. Even with inline placement following manufacturing, we achieved rapid cooling and rapid heating of the workpiece temperature, resulting in increased production efficiency. [Implementation Effects] - Rapid cooling and rapid heating - Compatibility with various product lines *For more details, please refer to the PDF document or feel free to contact us.

  • Automatic Control Equipment
  • Test Systems

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V2X Testing

V2X Testing

Please take a look at our V2X test solution!!

The V2X test solution verifies communication performance between vehicles, between vehicles and infrastructure, and between vehicles and pedestrians, providing the necessary data to ensure the safety of autonomous vehicles.

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  • others
  • Test Systems

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V2Xドライビングテストシステム『WCEX-DRTS』

V2Xドライビングテストシステム『WCEX-DRTS』

SAE規格に準拠したBSMの送信確認が可能。位置・高度・進行方向の精度確認や急ブレーキ試験にも対応

『WCEX-DRTS』は、OBUから送信されるBSMがSAE J2945/1およびJ3161/1に 準拠しているかを実走行環境で確認できるV2Xドライビングテストシステムです。 BSMメッセージに記載された自車の位置情報が正しい位置情報として 記載されているかをリアルタイムで確認でき、位置・高度・進行方向の 精度確認や急ブレーキに関するコンプライアンステストを実施可能。 米国OmniAir認定取得の試験装置（2023年11月OQTE認証）として、 V2X機器の規格適合確認およびコンプライアンステストに活用できます。 【特長】 ■OBUから送信されるBSMがSAE J2945/1、J3161/1に準拠しているか確認可能 ■SAE J2945/1、J3161/1コンプライアンステストを実施可能 ■位置・高度・進行方向の精度確認および急ブレーキ試験に対応 ■韓国の試験場で実際に試験装置を使用した実績あり ※詳しくは資料をご覧ください。お問い合わせもお気軽にどうぞ。

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  • Test Systems

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Small Electronic Component Leak Test System LZ-3000

Small Electronic Component Leak Test System LZ-3000

Achieving automation of high-speed and high-precision gloss leak testing.

The increasingly miniaturized SMD crystal devices. The LZ-3000 series is an automatic leak inspection system developed to meet the demand for high-speed processing in gross leak testing of small electronic components, including hermetically sealed SMD crystal devices. We provide the optimal system for enhancing your production efficiency and improving your quality control system.

  • Non-destructive testing
  • Test Systems

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